An artistic rendering of an AFM scan showing material degradation at the nanoscale.

Unlocking the Secrets of Wear: A New Microscope Method Reveals All

Lena Kashyap in Science & Nature August 2025 • 5 min read.

"Scientists develop a revolutionary method using atomic force microscopy to measure and understand wear at the nanoscale, promising insights for everything from microdevices to materials science."

The world around us is constantly in motion, and with every interaction, materials experience wear. From the microscopic components of our smartphones to the massive gears of industrial machinery, understanding how materials degrade over time is crucial. Now, scientists have developed a groundbreaking new method to examine this process at the atomic level, using a technique called atomic force microscopy (AFM).

This innovative approach, described in a recent scientific publication, offers unprecedented insights into the mechanisms of wear. By measuring the minute changes in a material's surface, researchers can now gain a deeper understanding of the forces and processes that lead to degradation. This knowledge promises to revolutionize how we design and manufacture everything from tiny microdevices to large-scale engineering projects.

The key to this new method lies in its simplicity and precision. By focusing on the contact area between surfaces, researchers can determine the rate of material removal without relying on complex assumptions or specialized equipment. This opens the door to a new era of wear testing, one that's more efficient, accessible, and capable of revealing the fundamental principles governing material degradation.

How the New AFM-Based Method Works: A Step-by-Step Guide

An artistic rendering of an AFM scan showing material degradation at the nanoscale.

At the heart of this new method is the atomic force microscope (AFM), a powerful tool capable of imaging surfaces at the nanoscale. AFM works by using a tiny probe, essentially a microscopic needle, to scan across a surface. As the probe encounters features, it deflects, allowing researchers to create detailed maps of the surface.

The new method builds upon this established technique by focusing on the wear process. When two materials are in contact and subjected to motion, such as sliding, wear occurs. The AFM probe scans a specialized reference sample with sharp spikes to determine the contact area, which is crucial for calculating the rate of material removal. This allows scientists to study the wear process in detail.

Scanning with the AFM: The AFM probe is used to scan the surface of a material, such as silicon, to measure the contact area.
Measuring the contact area: The contact area is determined by scanning the worn probe against a sample with sharp spikes. This allows researchers to analyze the shape of the probe and determine how much material has worn away.
Calculating the Wear Rate: Using this information, along with measurements of the probe's geometry, the researchers can calculate the rate at which the material is being removed.

A significant advantage of this method is that it doesn't rely on complex calculations or specialized equipment. Researchers can use images of sharp spikes to determine the contact area, eliminating the need for advanced computer algorithms or assumptions about the material's behavior. This makes the technique more accessible and allows for faster, more efficient wear testing.

The Future of Wear Research and Beyond

This new AFM-based method represents a significant step forward in the study of wear. By providing a simple, yet powerful tool for measuring material degradation at the nanoscale, it opens up new avenues for research and development. With this technology, scientists and engineers can now more efficiently study wear, develop more durable materials, and create longer-lasting devices. As our world becomes increasingly reliant on nanoscale technologies, this method is sure to play a vital role in ensuring their reliability and longevity.

About this Article -

This article was crafted using a human-AI hybrid and collaborative approach. AI assisted our team with initial drafting, research insights, identifying key questions, and image generation. Our human editors guided topic selection, defined the angle, structured the content, ensured factual accuracy and relevance, refined the tone, and conducted thorough editing to deliver helpful, high-quality information.See our About page for more information.

This article is based on research published under:

DOI-LINK: 10.1063/1.5048584, Alternate LINK

Title: A Simple Atomic Force Microscope-Based Method For Quantifying Wear Of Sliding Probes

Subject: Instrumentation

Journal: Review of Scientific Instruments

Publisher: AIP Publishing

Authors: Erin E. Flater, Jared D. Barnes, Jesse A. Hitz Graff, Jayse M. Weaver, Naveed Ansari, Aimee R. Poda, W. Robert Ashurst, Subarna R. Khanal, Tevis D. B. Jacobs

Published: 2018-11-01

Everything You Need To Know

What is atomic force microscopy (AFM), and how does this new method utilize it to study wear?

Atomic force microscopy (AFM) is a technique used to image surfaces at the nanoscale. It employs a tiny probe to scan the surface of a material. As the probe encounters surface features, it deflects, allowing researchers to create detailed maps. The new method utilizes AFM to measure the contact area during wear, by scanning a specialized reference sample with sharp spikes to determine the contact area, which is crucial for calculating the rate of material removal. This allows for detailed examination of the wear process.

How does this new method simplify wear testing compared to previous approaches?

The new atomic force microscopy (AFM)-based method simplifies wear testing by focusing on the contact area between surfaces to determine the rate of material removal. It eliminates the need for complex calculations or specialized equipment because Researchers can use images of sharp spikes to determine the contact area, eliminating the need for advanced computer algorithms or assumptions about the material's behavior. This makes wear testing more efficient, accessible, and capable of revealing the fundamental principles governing material degradation.

What are the implications of this new atomic force microscopy (AFM) method for the development of nanoscale technologies?

As the world becomes increasingly reliant on nanoscale technologies, the atomic force microscopy (AFM) method is poised to play a vital role in ensuring their reliability and longevity. By providing a simple yet powerful tool for measuring material degradation at the nanoscale, it opens up new avenues for research and development. This allows scientists and engineers to more efficiently study wear, develop more durable materials, and create longer-lasting nanoscale devices.

What specific steps are involved in using this new atomic force microscopy (AFM) method to measure wear, and why is measuring the contact area so important?

The atomic force microscopy (AFM) method involves three key steps: (1) Scanning the material surface, such as silicon, with the AFM probe. (2) Measuring the contact area by scanning the worn probe against a sample with sharp spikes to analyze the probe's shape and determine material loss. (3) Calculating the wear rate using the contact area information and probe geometry measurements. Measuring the contact area is crucial because it directly relates to the amount of material being removed and provides a fundamental measure of wear without relying on complex models.

Beyond microdevices and materials science, where else might this new atomic force microscopy (AFM) technique for measuring wear be applied, and what kind of impact could it have?

While the immediate applications of the new atomic force microscopy (AFM) technique are in microdevices and materials science, its potential extends to any field where material degradation is a concern. This could include the automotive industry (improving engine components), aerospace engineering (developing more durable aircraft materials), and even biomedical engineering (designing longer-lasting implants). The impact could be significant, leading to more reliable products, reduced maintenance costs, and increased safety across various sectors.