Millimeter Wave Imaging of a Chocolate Bar

See Through Anything? The Future of Millimeter Wave Imaging is Here

Theo Raines in Tech & Innovation June 2025 • 4 min read.

"New advances in millimeter wave technology promise to revolutionize quality control and product safety in ways you never imagined."

In today's fast-paced manufacturing world, ensuring product quality is more critical than ever. From the raw materials to the final packaged goods, every step must meet stringent standards to satisfy customers and avoid costly recalls. Imagine a technology that could peer inside sealed packages, detect the tiniest imperfections, and guarantee the safety and integrity of your favorite products. This isn't science fiction; it's the reality of millimeter wave imaging.

Traditional quality assurance methods often fall short. X-ray systems, while effective for detecting metal and some glass contaminants, struggle with hydrocarbon-based materials like plastics and wood. Optical cameras offer high resolution but can't see beyond the surface, leaving hidden impurities undetected. This is particularly problematic in the food industry, where foreign particles can compromise product safety and brand reputation.

Enter the stand-alone millimeter wave imaging scanner (SAMMITM), a revolutionary system designed to overcome these limitations. This technology utilizes millimeter waves to measure the structure and composition of materials, identifying defects and variations that are invisible to the naked eye. This article explores how this innovative system works, its potential applications, and the future of quality control in manufacturing.

How Does Millimeter Wave Imaging Work?

Millimeter Wave Imaging of a Chocolate Bar

The SAMMITM system employs an imaging approach, leveraging established image processing algorithms to create high-resolution images. Unlike traditional methods that require expensive full scan line arrays, this system uses a rotating scanner with a single measurement channel. This innovative design allows for high pixel density even at medium measurement object velocities, making it both efficient and cost-effective.

The system operates at 90 GHz in a continuous wave mode. The transmitter sends out a signal, which is then modulated and processed by sophisticated electronics. As the millimeter waves pass through the object being scanned, they interact with the material's structure and composition. The receiver captures the altered signal, providing valuable information about the object's internal characteristics.

Transmitter and Receiver: The system uses a transmitter to emit millimeter waves and a receiver to capture the signal after it has interacted with the object.
Rotating Scanner: A rotating mechanism scans the object, allowing for high-resolution imaging without the need for a large array of sensors.
Signal Processing: Sophisticated algorithms analyze the received signal to create detailed images of the object's internal structure.
Image Fusion: Data from millimeter wave imaging is combined with optical images to provide a comprehensive view of the object.

The data acquired by the system is then processed using complex algorithms to generate amplitude and phase images. These images reveal variations in the material's dielectric properties, allowing for the detection of metallic splinters and small dielectric impurities. By fusing amplitude and phase data, the system provides a comprehensive analysis of the scanned object.

The Future of Quality Control is Here

The SAMMITM system represents a significant step forward in quality control and product safety. Its ability to detect hidden defects and variations in a wide range of materials makes it an invaluable tool for manufacturers across various industries. As the technology continues to evolve, we can expect even more sophisticated applications, ensuring higher quality standards and safer products for consumers.

About this Article -

This article was crafted using a human-AI hybrid and collaborative approach. AI assisted our team with initial drafting, research insights, identifying key questions, and image generation. Our human editors guided topic selection, defined the angle, structured the content, ensured factual accuracy and relevance, refined the tone, and conducted thorough editing to deliver helpful, high-quality information.See our About page for more information.

This article is based on research published under:

DOI-LINK: 10.23919/eurad.2018.8546573, Alternate LINK

Title: A Stand Alone Millimetre Wave Imaging Scanner: System Design And Image Analysis Setup

Journal: 2018 15th European Radar Conference (EuRAD)

Publisher: IEEE

Authors: Andries Kuter, Christopher Schwabig, Christian Krebs, Ralf Brauns, Stefan Kose, Dirk Nusler

Published: 2018-09-01

Everything You Need To Know

How does the SAMMITM system use millimeter wave imaging to inspect objects?

The SAMMITM system utilizes millimeter waves to measure the structure and composition of materials. A transmitter emits millimeter waves which then interact with the scanned object. A receiver captures the altered signal, providing data about the object's internal characteristics. Sophisticated algorithms then process this data to generate amplitude and phase images, revealing variations in the material's dielectric properties.

What are the shortcomings of traditional quality assurance methods, and how does the SAMMITM system improve upon them?

Traditional quality assurance methods like X-ray systems and optical cameras have limitations. X-rays struggle with hydrocarbon-based materials, and optical cameras can't see beyond the surface, which leaves hidden impurities undetected. The SAMMITM system overcomes these limitations by using millimeter wave imaging to detect hidden defects and variations in a wide range of materials.

How does the SAMMITM system achieve high-resolution imaging without using expensive full scan line arrays?

The SAMMITM system uses a rotating scanner with a single measurement channel, allowing for high pixel density even at medium measurement object velocities. This differs from traditional methods that require expensive full scan line arrays. This design makes the system efficient and cost-effective, all while maintaining high resolution.

How is data from millimeter wave imaging combined with other imaging techniques in the SAMMITM system, and what does this achieve?

The SAMMITM system combines data from millimeter wave imaging with optical images to provide a comprehensive view of the scanned object. This "image fusion" allows for a more detailed analysis, combining the strengths of both technologies. The system generates both amplitude and phase images, which are then analyzed to detect variations in the material's dielectric properties, leading to the identification of metallic splinters and small dielectric impurities.

What are the long-term implications of implementing the SAMMITM system in manufacturing, particularly regarding quality control and product safety?

The implications of using the SAMMITM system in manufacturing quality control are far-reaching. The system can detect hidden defects and variations in a wide range of materials. This leads to higher quality standards and safer products. The ability to identify foreign particles, especially in the food industry, helps maintain brand reputation and prevent costly recalls. As the technology evolves, even more sophisticated applications can be expected, further enhancing quality control and product safety.