Boron atoms forming a thin film

Boron Breakthrough: How a New Calibration Method is Enhancing Material Analysis

Samir D’Costa in Science & Nature September 2025 • 4 min read.

"Discover how a hybrid comparator method is improving the accuracy of boron quantification in semiconductor films, impacting the future of electronics and material science."

Prompt gamma activation analysis (PGAA) has emerged as a game-changing nuclear analytical technique, its impact rippling across diverse applications. PGAA's versatility shines in the world of material science, environmental monitoring, and even archaeometry. The method is well documented, providing insights into everything from trace elements in environmental samples to the composition of ancient artifacts.

One of PGAA's most compelling strengths lies in its ability to quantify even the smallest amounts of elements. For instance, it can detect less than 10 ng g¯¹ in certain materials, positioning PGAA as a top contender for non-destructive analytical techniques. In the realm of thin-film semiconductors, where minute variations in composition can significantly impact device performance, PGAA has become invaluable.

However, achieving precise and reliable measurements with PGAA isn't always straightforward. The method requires careful calibration and standardization to ensure that the results accurately reflect the composition of the sample. Challenges arise due to variations in sample geometry, non-uniform neutron flux, and the limited availability of suitable reference materials. To overcome these obstacles, researchers are continually developing innovative calibration methods that improve the accuracy and applicability of PGAA.

What is the Hybrid Comparator Method and How Does It Improve Boron Quantification?

Researchers at the Nuclear Engineering Teaching Laboratory at The University of Texas at Austin have developed an innovative approach to boron quantification. This hybrid comparator method combines elements of both absolute and relative calibration techniques to enhance the accuracy of PGAA measurements.

Here are the challenges this new technique solves:

Addresses variations in sample geometry.
Accounts for the non-uniform neutron flux.
Circumvents the limited availability of suitable reference materials.

This method uses aluminum as a reference material. Aluminum is inexpensive and easily machinable, so aluminum samples were manufactured with high tolerances to match the geometry of each sample of interest. Each boron carbide film sample and its congruent aluminum sample were measured in the PGAA system. The measured aluminum responses and relevant nuclear parameters were used to standardize the measurements. Quality control measurements using this standard show that the method provided accuracy to within 5% for boron quantification.

The Future of Material Analysis

The hybrid comparator method represents a significant step forward in PGAA calibration techniques. By combining the strengths of both absolute and relative calibration methods, this approach overcomes many of the limitations associated with traditional methods. As a result, it offers a more accurate, reliable, and versatile approach to boron quantification in thin-film semiconductors.

About this Article -

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This article is based on research published under:

DOI-LINK: 10.1007/s10967-018-6062-3, Alternate LINK

Title: Development Of Boron Calibration Via Hybrid Comparator Method In Prompt Gamma Activation Analysis

Subject: Health, Toxicology and Mutagenesis

Journal: Journal of Radioanalytical and Nuclear Chemistry

Publisher: Springer Science and Business Media LLC

Authors: E. J. Artnak, S. R. Biegalski, S. Landsberger, N. J. Ianno, D. Alexander, M. F. Byers

Published: 2018-08-14

Everything You Need To Know

What is the hybrid comparator method?

The hybrid comparator method is a novel approach developed to improve the accuracy of boron quantification in semiconductor films. It combines elements of absolute and relative calibration techniques. It overcomes the limitations of traditional methods by addressing variations in sample geometry, non-uniform neutron flux, and the scarcity of suitable reference materials. Using aluminum as a reference material, this method allows for more accurate and reliable measurements in PGAA.

Why is accurate boron quantification important?

Boron quantification is crucial in semiconductor films because minute variations in composition can significantly impact device performance. Accurate measurement of boron levels is therefore essential for the quality control and optimization of electronic devices. The hybrid comparator method directly addresses this need by providing a more accurate and versatile approach to boron quantification, ensuring the reliability and advancement of electronics and material science.

What is Prompt Gamma Activation Analysis (PGAA)?

Prompt gamma activation analysis (PGAA) is a nuclear analytical technique used to determine the elemental composition of a material. Its versatility lies in its ability to analyze various materials, from environmental samples to ancient artifacts, by quantifying even the smallest amounts of elements. PGAA's non-destructive nature and sensitivity make it a valuable tool in material science and related fields.

Why is aluminum used as a reference material in the hybrid comparator method?

The hybrid comparator method utilizes aluminum as a reference material due to its availability, cost-effectiveness, and ease of machinability. Aluminum samples are manufactured with high tolerances to match the geometry of the boron carbide film samples. By measuring both the boron carbide film sample and its congruent aluminum sample within the PGAA system, researchers can standardize measurements. This approach facilitates accurate boron quantification.

What is the significance of the hybrid comparator method?

The hybrid comparator method's significance lies in its ability to enhance the accuracy, reliability, and versatility of boron quantification within thin-film semiconductors. By mitigating the challenges associated with traditional calibration methods, such as sample geometry and neutron flux, this method ensures more precise measurements. This ultimately leads to improvements in the quality control of semiconductor manufacturing and further advancements in electronics and material science.